2026, Vol. 7, Issue 1, Part B

Powder X-ray diffraction (PXRD) analysis was employed to investigate the crystalline nature and structural characteristics of newly synthesized Schiff base metal complexes of Cu(II), Ni(II), Co(II) and Zn(II). Diffraction patterns were recorded using Cu Kα radiation in the 2θ range of 10°-80°. All complexes exhibited sharp and well-defined peaks, confirming their crystalline nature. Indexing of diffraction peaks revealed that the complexes predominantly crystallize in a monoclinic crystal system. The crystallite size calculated using Scherrer’s equation ranged between 28-62 nm, indicating nanocrystalline behavior. The absence of extra peaks confirmed high phase purity and successful metal coordination. PXRD analysis thus provides strong evidence for structural integrity, stability, and successful formation of the synthesized complexes.